From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection 文章

ArXiv CS.CV2026-05-26NEWSen作者: Mohammad Alijanpour Shalmani, Alale Rezvani Boroujeni, Ali Amini, Jiann Shiun Yuan
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From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection · 相关技术

相关技术

tile-based inference