Structure-Guided Mixed Masked Pretraining and Spatial Continuity Regularization for Printed Circuit Board Defect Detection 文章

ArXiv CS.CV2026-06-03NEWSen作者: Peitong Wang, Nuo Wang, Enxin Qin, Chengjin Yu, Hanyu Xuan, Yuanting Yan

Structure-Guided Mixed Masked Pretraining and Spatial Continuity Regularization for Printed Circuit Board Defect Detection · 相关技术