Unsupervised Defect Detection for Surgical Instruments 文章

arXiv:2509.21561v2 Announce Type: replace Abstract: Ensuring the safety of surgical instruments requires reliable detection of visual defects. However, manual inspection is prone to error, and existing automated defect detection methods, typically trained on natural/industrial images, fail to transfer effectively to the surgical domain. We demonstrate that simply applying or fine-tuning these approaches leads to issues: false positive detections arising from textured backgrounds, poor sensitivity to small, subtle defects, and inadequate capture of instrument-specific features due to domain shift. To address these challenges, we propose a versatile method that adapts unsupervised defect detection methods specifically for surgical instruments. By integrating background masking, a patch-based analysis strategy, and efficient domain adaptation, our method overcomes these limitations, enabling the reliable detection of fine-grained defects in surgical instrument imagery.