Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation 文章

ArXiv CS.CV2026-06-02NEWSen作者: Ni Li, Nuohao Liu, Ryan Jacobs, Ajay Annamareddy, Maciej P. Polak, Kevin Field, Izabela Szlufarska, Dane Morgan
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Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation · 相关技术

相关技术

latent diffusion modelsMask Regional Convolutional Neural Networkmask-conditioned latent diffusion modeltransmission electron microscopy