Rough Path Signature-Guided Geometry Augmentation for Few-Shot Industrial Surface Defect Detection 文章

arXiv:2607.12245v1 Announce Type: new Abstract: Few-shot industrial defect detection remains difficult for standard supervised detectors, which achieve poor performance on boundary-dominated industrial defects. This paper proposes rough path signature-guided geometry augmentation (RPS-GA), a geometry-aware approach in which Canny edge contours are treated as ordered planar paths whose truncated second-order signature responses, especially the antisymmetric L\'evy-area term, are aggregated into a spatial map that highlights boundary-related structure through two fusion operators, SIG-AUG and SGAA. The approach is evaluated on NEU-DET and PCB-Defect under a few-shot protocol with 5, 10, 20, or 50 labeled images per class, using an unmodified YOLOv8n detector throughout. Compared with the baseline, RPS-GA delivers large gains when supervision is limited, although the margin shrinks as more labels become available. On NEU-DET, SIG-AUG raises 10-shot mAP@0.5 from 0.341 to 0.