摘要
arXiv:2607.27660v1 Announce Type: cross Abstract: Submodular Information Measures (SIMs) have recently emerged as a powerful framework for representation learning and multimodal learning. In particular, the SCORE framework~\cite{majee2024score} demonstrated that SIMs can serve as effective objectives for supervised contrastive learning. Despite their empirical success, however, the geometric and statistical properties induced by different submodular information measures remain poorly understood. In this work, we develop a unified theoretical framework connecting SIMs to classical concepts in representation learning and statistical pattern recognition. We show that Total Information (TI) objectives characterize intra-class structure: Graph Cut TI recovers within-class variance, LogDet TI recovers generalized variance and covariance volume, and Facility Location TI induces imbalance-aware separation that emphasizes rare and confusable classes.