UniPCB: A Generation-Assisted Detection Framework for PCB Defect Inspection 事件

UniPCB: A Generation-Assisted Detection Framework for PCB Defect Inspection arXiv:2605.04635v3 Announce Type: replace Abstract: In the Industrial Internet of Things (IIoT), enabling intelligent, real-time Printed Circuit Board (PCB) defect inspection is critical for ensuring product reliability. However, existing IIoT-based visual inspection systems face two compounding challenges: scarce and imbalanced defect samples that limit model training, and insufficient feature representation under comp