MemFail: Stress-Testing Failure Modes of LLM Memory Systems 事件

MemFail: Stress-Testing Failure Modes of LLM Memory Systems arXiv:2605.26667v1 Announce Type: new Abstract: Large language model (LLM) agents increasingly rely on external memory systems to remain consistent across long-horizon interactions, but little empirical work has been done to understand the specific failure modes and design choices that these systems present. Existing benchmarks report aggregate question-answering accuracy and treat memory systems as black boxes, making it impossible to