Unsupervised Deep Image Prior for Sparse-View and Limited-Angle Electron Tomography 事件

Unsupervised Deep Image Prior for Sparse-View and Limited-Angle Electron Tomography arXiv:2605.27139v1 Announce Type: cross Abstract: Electron tomography (ET) plays an important role in the three-dimensional (3D) characterization of nanomaterials. However, under limited-angle and sparse-view conditions, conventional algorithms produce degraded reconstructions, which compromise the quality and interpretability of resulting 3D data. In this paper, we present deep image prior (DIP), an unsupervise