Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation 事件

Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation arXiv:2606.02532v1 Announce Type: new Abstract: Analyzing microstructural defects in transmission electron microscopy (TEM) images, particularly in irradiated metal alloys, is often limited by the availability of high-quality, labeled data. To address this, we introduce a generative data augmentation approach using a mask-conditioned latent diffusion model (LDM) for synthesizing rea