From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection 事件

From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection arXiv:2605.24726v1 Announce Type: new Abstract: High-resolution printed circuit board (PCB) inspection suffers from resolution collapse when full-board images are resized to standard detector inputs: micro-scale defects shrink to a few pixels and are missed. Tile-based inference preserves local detail but introduces boundary artefacts at tile edges, causing split det