Self-Checking and Fault-Tolerant Digital Design 论文
1995引用 356
Radiation Effects in ElectronicsVLSI and Analog Circuit Testing
摘要
Chapter 1 - Fundamentals of Reliability Chapter 2 - Error Detecting and Correcting Codes Chapter 3 - Self-Checking Combinational Logic Design Chapter 4 - Self-Checking Checkers Chapter 5 - Self-Checking Sequential Circuit Design Chapter 6 - Fault-Tolerant Design Appendix Markov Models