Self-Checking and Fault-Tolerant Digital Design 论文

1995引用 356
Radiation Effects in ElectronicsVLSI and Analog Circuit Testing

摘要

Chapter 1 - Fundamentals of Reliability Chapter 2 - Error Detecting and Correcting Codes Chapter 3 - Self-Checking Combinational Logic Design Chapter 4 - Self-Checking Checkers Chapter 5 - Self-Checking Sequential Circuit Design Chapter 6 - Fault-Tolerant Design Appendix Markov Models

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