Delay Fault Testing for VLSI Circuits 论文

1998Frontiers in electronic testing引用 308
DOI
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisPhysical Unclonable Functions (PUFs) and Hardware Security
VLSI and Analog Circuit TestingPhysical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure Analysis
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