Reducing test application time for full scan embedded cores 论文

2003引用 337
DOI
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems
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Reducing test application time for full scan embedded cores · 相关技术

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