IBM experiments in soft fails in computer electronics (1978–1994) 论文
1996IBM Journal of Research and Development引用 453
Radiation Effects in ElectronicsVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure Analysis
摘要
This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.