Stokes vectors, Mueller matrices, and polarized scattered light 论文
1985American Journal of Physics引用 332
Optical Polarization and EllipsometrySurface Roughness and Optical MeasurementsOptical measurement and interference techniques
摘要
The complete characterization of scattered light is described in the context of Stokes vectors and Mueller matrices which highly motivates the measuring procedures. The most general form of the scattering matrix coupled with polarizers and quarter wave plates elegantly demonstrates the physical relationship among the matrix elements and polarization measurements.