16.2 A 0.19pJ/b PVT-variation-tolerant hybrid physically unclonable function circuit for 100% stable secure key generation in 22nm CMOS 论文

摘要

Physically unclonable function (PUF) circuits are low-cost cryptographic primitives used for generation of unique, stable and secure keys or chip IDs for device authentication and data security in high-performance microprocessors [1][2][3][7]. The volatile nature of PUFs provides a high level of security and tamper resistance against invasive probing attacks compared to conventional fuse-based key storage technologies [4]. A process-voltage-temperature (PVT) variation-tolerant all-digital PUF array targeted for on-die generation of 100% stable, device-specific, high-entropy keys is fabricated in 22nm tri-gate high-κ metal-gate CMOS technology [5], featuring: i) a hybrid delay/cross-coupled PUF circuit where interaction of 16 minimum-sized, variation-impacted transistors determines resolution dynamics, ii) a temporal majority voting (TMV) circuit to stabilize occasionally unstable bits, resulting in 53% reduction in instability, iii) burn-in hardening to reinforce manufacturing-time PUF bias, resulting in 22% reduction in bit-errors, iv) soft dark bits for run-time identification and sequestration of highly unstable bits during field operation, resulting in 78% lower bit-errors, v) 19× separation between inter- and intra-PUF Hamming distance, enabling die-specific keys, vi) autocorrelation factor≈0 and entropy=0.9997, while passing NIST randomness tests, vii) high tolerance to voltage and temperature variation with 82% reduction in average Hamming-distance using a 100-cycle dark bit window, viii) in-situ PUF hardening by leveraging directed NBTI aging to improve stability during field operation, and ix) ultra-low energy consumption of 0.19pJ/b with compact bitcell layout of 4.66μm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> (Fig. 16.2.7a).