The Test Access Port and Boundary-Scan Architecture 论文
1990引用 803
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems
详细信息
- 发表日期
- 1990-01-01
- 发表年份
- 1990
关键词
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems