Two-dimensional fringe-pattern analysis 论文

详细信息

发表期刊/会议

Applied Optics

发表日期

1983-12-01

发表年份

1983

摘要

Two-dimensional sinusoid fitting and Fourier transform methods of analyzing fringes to determine the wave-front topography are described. The methods are easy to apply because they do not require finding fringe centers and fringe orders. Also, they are accurate. For an active optics experiment in which we have used these techniques, experimental noise exceeds the error resulting from analysis of noise-free theoretical fringe patterns.