Gate sizing to radiation harden combinational logic 论文

2005IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems引用 338
DOI
Radiation Effects in ElectronicsLow-power high-performance VLSI designVLSI and Analog Circuit Testing
Low-power high-performance VLSI designVLSI and Analog Circuit TestingRadiation Effects in Electronics
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Gate sizing to radiation harden combinational logic · 相关技术

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