Charge Collection and Charge Sharing in a 130 nm CMOS Technology 论文

2006IEEE Transactions on Nuclear Science引用 396
DOI
Radiation Effects in ElectronicsVLSI and Analog Circuit TestingPhysical Unclonable Functions (PUFs) and Hardware Security
VLSI and Analog Circuit TestingPhysical Unclonable Functions (PUFs) and Hardware SecurityRadiation Effects in Electronics
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Charge Collection and Charge Sharing in a 130 nm CMOS Technology · 相关技术

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