New approximation to the Voigt function with applications to spectral-line profile analysis 论文

1973Journal of the Optical Society of America引用 231
DOI
Surface Roughness and Optical MeasurementsAdvanced Measurement and Metrology TechniquesOptical measurement and interference techniques
Optical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesSurface Roughness and Optical Measurements
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New approximation to the Voigt function with applications to spectral-line profile analysis · 作者

J

John F. Kielkopf