Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain 论文

2014Proceedings of the IEEE引用 537

Physical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisRecycling and Waste Management Techniques

Physical Unclonable Functions (PUFs) and Hardware Security Integrated Circuits and Semiconductor Failure Analysis Recycling and Waste Management Techniques

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain · 作者

Yiorgos Makris

Mohammad Tehranipoor

John M. Carulli

Daniel DiMase

Ujjwal Guin