Radiation-Induced Soft Errors in Advanced Semiconductor Technologies 论文

2005IEEE Transactions on Device and Materials Reliability引用 976
DOI
Radiation Effects in ElectronicsReliability and Maintenance OptimizationVLSI and Analog Circuit Testing
VLSI and Analog Circuit TestingRadiation Effects in ElectronicsReliability and Maintenance Optimization
相关技术:Reliability and Maintenance Optimization
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Radiation-Induced Soft Errors in Advanced Semiconductor Technologies · 作者

R

R. Baumann