Embedded Deterministic Test 论文

2004IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems引用 523
DOI
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques
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Embedded Deterministic Test · 作者

N

Nilanjan Mukherjee

M

Mark Kassab

J

Jerzy Tyszer

J

Janusz Rajski