Cost-effective approach for reducing soft error failure rate in logic circuits 论文

2004引用 273
DOI
Radiation Effects in ElectronicsVLSI and Analog Circuit TestingLow-power high-performance VLSI design
Low-power high-performance VLSI designVLSI and Analog Circuit TestingRadiation Effects in Electronics
关系图谱

Cost-effective approach for reducing soft error failure rate in logic circuits · 作者

N

Nur A. Touba

K

Kartik Mohanram