Defect tolerance in VLSI circuits: techniques and yield analysis 论文

1998Proceedings of the IEEE引用 233
DOI
VLSI and Analog Circuit TestingRadiation Effects in ElectronicsVLSI and FPGA Design Techniques
VLSI and FPGA Design TechniquesVLSI and Analog Circuit TestingRadiation Effects in Electronics
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Defect tolerance in VLSI circuits: techniques and yield analysis · 作者

Z

Zahava Koren

I

Israel Koren