Testing Semiconductor Memories: Theory and Practice 论文
1998Medical Entomology and Zoology引用 806
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems
详细信息
- 发表期刊/会议
- Medical Entomology and Zoology
- 发表日期
- 1998-09-01
- 发表年份
- 1998
关键词
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems
摘要
Memory modeling functional testing: reduced functional RAM chip model functional RAM chip testing functional ROM chip testing functional memory array testing functional memory board testing electrical testing: parametric testing dynamic testing on chip testing conclusions: address line scrambling various proofs software package.