Improved disk-drive failure warnings 论文

2002IEEE Transactions on Reliability引用 220
DOI
Advanced Statistical Process MonitoringIntegrated Circuits and Semiconductor Failure AnalysisVLSI and Analog Circuit Testing
VLSI and Analog Circuit TestingAdvanced Statistical Process MonitoringIntegrated Circuits and Semiconductor Failure Analysis
关系图谱

Improved disk-drive failure warnings · 作者

C

Charles Elkan

K

Kenneth Kreutz-Delgado

J

Joseph F. Murray

G

Gordon F. Hughes