A three-step method for the de-embedding of high-frequency S-parameter measurements 论文

1991IEEE Transactions on Electron Devices引用 318
DOI
VLSI and Analog Circuit TestingElectromagnetic Compatibility and Noise SuppressionIntegrated Circuits and Semiconductor Failure Analysis
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisElectromagnetic Compatibility and Noise Suppression
关系图谱

A three-step method for the de-embedding of high-frequency S-parameter measurements · 相关技术

暂无数据