Software-based self-testing methodology for processor cores 论文

2001IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems引用 231
DOI
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisRadiation Effects in Electronics
VLSI and Analog Circuit TestingRadiation Effects in ElectronicsIntegrated Circuits and Semiconductor Failure Analysis
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Software-based self-testing methodology for processor cores · 相关技术

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