Prediction of analog performance parameters using fast transient testing 论文

2002IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems引用 275
DOI
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisVLSI and FPGA Design Techniques
半导体VLSI and FPGA Design TechniquesVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure Analysis
关系图谱

Prediction of analog performance parameters using fast transient testing · 作者

A

Abhijit Chatterjee

S

S. Cherubal

P

P.N. Variyam