On optimum recognition error and reject tradeoff 论文
1970IEEE Transactions on Information Theory引用 853
Machine Learning and AlgorithmsNeural Networks and Applications
详细信息
- 发表期刊/会议
- IEEE Transactions on Information Theory
- 发表日期
- 1970-01-01
- 发表年份
- 1970
关键词
Machine Learning and AlgorithmsNeural Networks and Applications
摘要
The performance of a pattern recognition system is characterized by its error and reject tradeoff. This paper describes an optimum rejection rule and presents a general relation between the error and reject probabilities and some simple properties of the tradeoff in the optimum recognition system. The error rate can be directly evaluated from the reject function. Some practical implications of the results are discussed. Examples in normal distributions and uniform distributions are given.