Which concurrent error detection scheme to choose ? 论文

2002引用 295
DOI
Radiation Effects in ElectronicsVLSI and Analog Circuit TestingInterconnection Networks and Systems
VLSI and Analog Circuit TestingInterconnection Networks and SystemsRadiation Effects in Electronics
相关技术:Interconnection Networks and Systems
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Which concurrent error detection scheme to choose ? · 作者

E

E.J. McCluskey

S

Subhasish Mitra