Design of Low-Power High-Speed Truncation-Error-Tolerant Adder and Its Application in Digital Signal Processing 论文

2009IEEE Transactions on Very Large Scale Integration (VLSI) Systems引用 376
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VLSI and Analog Circuit TestingRadiation Effects in ElectronicsLow-power high-performance VLSI design
Low-power high-performance VLSI designVLSI and Analog Circuit TestingRadiation Effects in Electronics
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Design of Low-Power High-Speed Truncation-Error-Tolerant Adder and Its Application in Digital Signal Processing · 相关技术

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