Minimized power consumption for scan-based BIST 论文

2003引用 301
DOI
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisVLSI and FPGA Design Techniques
半导体VLSI and FPGA Design TechniquesVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure Analysis
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