A tutorial introduction to research on analog and mixed-signal circuit testing 论文
1998IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing引用 272
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisLow-power high-performance VLSI design
详细信息
- 发表期刊/会议
- IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing
- 发表日期
- 1998-01-01
- 发表年份
- 1998
关键词
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisLow-power high-performance VLSI design
摘要
Traditionally, work on analog testing has focused on diagnosing faults in board designs. Recently, with increasing levels of integration, not just diagnosing faults, but distinguishing between faulty and good circuits has become a problem. Analog blocks embedded in digital systems may not easily be separately testable. Consequently, many papers have been recently written proposing techniques to reduce the burden of testing analog and mined-signal circuits. This survey attempts to outline some of this recent work, ranging from tools for simulation-based test set development and optimization to built-in self-test (BIST) circuitry.