Direct least square fitting of ellipses 论文
1999IEEE Transactions on Pattern Analysis and Machine Intelligence引用 2717
Image and Object Detection TechniquesImage Processing and 3D ReconstructionMineral Processing and Grinding
摘要
This work presents a new efficient method for fitting ellipses to scattered data. Previous algorithms either fitted general conics or were computationally expensive. By minimizing the algebraic distance subject to the constraint 4ac-b/sup 2/=1, the new method incorporates the ellipticity constraint into the normalization factor. The proposed method combines several advantages: It is ellipse-specific, so that even bad data will always return an ellipse. It can be solved naturally by a generalized eigensystem. It is extremely robust, efficient, and easy to implement.