A high-resolution time-to-digital converter implemented in field-programmable-gate-arrays 论文
2006IEEE Transactions on Nuclear Science引用 234
Advancements in PLL and VCO TechnologiesAnalog and Mixed-Signal Circuit DesignVLSI and Analog Circuit Testing
摘要
A high-resolution time-to-digital converter (TDC) implemented in a general purpose field-programmable-gate-array (FPGA) is presented. Dedicated carry lines of an FPGA are used as delay cells to perform time interpolation within the system clock period and to realize the fine time measurement. Two Gray-code counters, working on in-phase and out-of-phase system clocks respectively, are designed to get the stable value of the coarse time measurement. The fine time code and the coarse time counter value, along with the channel identifier, are then written into a first-in first-out (FIFO) buffer. Tests have been done to verify the performance of the TDC. The resolution after calibration can reach 50 ps