A set of benchmarks for modular testing of SOCs 论文

2003引用 306
DOI
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems
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A set of benchmarks for modular testing of SOCs · 作者

K

Krishnendu Chakrabarty

V

V. Iyengar

E

Erik Jan Marinissen