A test generation strategy for pairwise testing 论文

2002IEEE Transactions on Software Engineering引用 367
Software Testing and Debugging TechniquesVLSI and Analog Circuit TestingFormal Methods in Verification

摘要

Pairwise testing is a specification-based testing criterion which requires that for each pair of input parameters of a system, every combination of valid values of these two parameters be covered by at least one test case. The authors propose a novel test generation strategy for pairwise testing.

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