A test generation strategy for pairwise testing 论文
2002IEEE Transactions on Software Engineering引用 367
Software Testing and Debugging TechniquesVLSI and Analog Circuit TestingFormal Methods in Verification
摘要
Pairwise testing is a specification-based testing criterion which requires that for each pair of input parameters of a system, every combination of valid values of these two parameters be covered by at least one test case. The authors propose a novel test generation strategy for pairwise testing.