Robust system design with built-in soft-error resilience 论文

详细信息

发表期刊/会议

Computer

发表日期

2005-02-01

发表年份

2005

摘要

Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.