Microprocessor Software-Based Self-Testing 论文
2010IEEE Design & Test of Computers引用 253
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems
摘要
This article discusses the potential role of software-based self-testing in the microprocessor test and validation process, as well as its supplementary role in other classic functional- and structural-test methods. In addition, the article proposes a taxonomy for different SBST methodologies according to their test program development philosophy, and summarizes research approaches based on SBST techniques for optimizing other key aspects.
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