IPOG/IPOG‐D: efficient test generation for multi‐way combinatorial testing 论文

2007Software Testing Verification and Reliability引用 243
DOI
Software Testing and Debugging TechniquesVLSI and Analog Circuit TestingSoftware Reliability and Analysis Research
Software Testing and Debugging TechniquesVLSI and Analog Circuit TestingSoftware Reliability and Analysis Research
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IPOG/IPOG‐D: efficient test generation for multi‐way combinatorial testing · 相关技术

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