Dominique Schreurs 人物
相关论文查看全部 (2)
Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures
2001IEEE Transactions on Electron Devices引用 256
Wearable Wireless Health Monitoring: Current Developments, Challenges, and Future Trends
2015IEEE Microwave Magazine引用 249
相关事件
暂无数据
相关专利
暂无数据
相关文章
暂无数据