Self-Reflective Generation at Test Time 文章

ArXiv CS.CL2026-06-01NEWSen作者: Jian Mu, Qixin Zhang, Zhiyong Wang, Menglin Yang, Shuang Qiu, Chengwei Qin, Zhongxiang Dai, Yao Shu

摘要

arXiv:2510.02919v2 Announce Type: replace Abstract: Large language models (LLMs) increasingly solve complex reasoning tasks via long chain-of-thought, but their forward-only autoregressive generation process is fragile; early token errors can cascade, which creates a clear need for self-reflection mechanisms. However, existing self-reflection either performs revisions over full drafts or learns self-correction via expensive training, both fundamentally reactive and inefficient. To address this, we propose Self-Reflective Generation at Test Time (SRGen), a lightweight test-time framework that reflects before generating at uncertain points. During token generation, SRGen utilizes dynamic entropy thresholding to identify high-uncertainty tokens. For each identified token, it trains a specific corrective vector, which fully exploits the already generated context for a self-reflective generation to correct the token probability distribution.