Self-Reflective Generation at Test Time 文章

ArXiv CS.CL2026-06-01NEWSen作者: Jian Mu, Qixin Zhang, Zhiyong Wang, Menglin Yang, Shuang Qiu, Chengwei Qin, Zhongxiang Dai, Yao Shu
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Self-Reflective Generation at Test Time · 相关技术

相关技术

corrective vectordynamic entropy thresholdingself-reflectionchain-of-thoughtlarge language models