Real-Time Industrial Defect Detection on Edge Hardware Using Fine-Tuned YOLOv8: A Systematic Benchmark on the NEU Surface Defect Database and MVTec AD with Automotive & Battery Manufacturing Extensions 文章

arXiv:2606.07659v1 Announce Type: new Abstract: Automated surface defect detection is critical for ensuring rigorous quality control in high-speed manufacturing environments. While deep learning models offer remarkable accuracy, deploying them on resource-constrained edge hardware without introducing significant latency remains a persistent challenge. This paper presents Industrial-YOLO, an edge-optimized framework built upon a fine-tuned YOLOv8 architecture specifically engineered for real-time industrial defect detection. We conduct a systematic benchmark utilizing the NEU surface defect database for steel sheets and the MVTec AD dataset, supplemented with custom automotive manufacturing extensions representing real-world structural anomalies (scratches, pits, and inclusions). To bridge the gap between algorithmic complexity and edge hardware constraints, target-specific optimizations are introduced via TensorRT and OpenVINO acceleration engines.