Real-Time Industrial Defect Detection on Edge Hardware Using Fine-Tuned YOLOv8: A Systematic Benchmark on the NEU Surface Defect Database and MVTec AD with Automotive & Battery Manufacturing Extensions 文章

ArXiv CS.CV2026-06-09NEWSen作者: Emmanuel Ezeji Somtochukwu, Nitesh Rijal
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Real-Time Industrial Defect Detection on Edge Hardware Using Fine-Tuned YOLOv8: A Systematic Benchmark on the NEU Surface Defect Database and MVTec AD with Automotive & Battery Manufacturing Extensions · 相关事件

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