Real-Time Industrial Defect Detection on Edge Hardware Using Fine-Tuned YOLOv8: A Systematic Benchmark on the NEU Surface Defect Database and MVTec AD with Automotive & Battery Manufacturing Extension 事件

Real-Time Industrial Defect Detection on Edge Hardware Using Fine-Tuned YOLOv8: A Systematic Benchmark on the NEU Surface Defect Database and MVTec AD with Automotive & Battery Manufacturing Extensions arXiv:2606.07659v1 Announce Type: new Abstract: Automated surface defect detection is critical for ensuring rigorous quality control in high-speed manufacturing environments. While deep learning models offer remarkable accuracy, deploying them on resource-constrained edge hardware without introdu